Scott Bruderer

Process Owner - Metrology Cd Sem

Scott Bruderer is a qualified expert, who works in Im Flash Technologies main office of which is in 9. on the position of Photolithography Engineering Supervisor from 2014. Scott gained professional experience in more than seven positions at different companies. Scott Bruderer went to the Brigham Young University and received education there from 2002 to 2007. Riverton, Utah is the area, where this person was lastly known to be settled. This professional's contacts can be easily accessed through this website by request.
Name variants:
Scotty Bruderer
Last updated Jun 15, 2024

Contact Information

Last Update
Jul 7, 2022
Email
sb**@imflash.com, sc**@hotmail.com
Location
Riverton, UT
Company
Im Flash Technologies

Workplace

Photolithography Engineering Supervisor

Work History

Photolithography Engineering Supervisor

4000 north Flash Dr, Lehi, UT 84005
Developed & Motivated Teams of 5 to 14 Engineers/Technicians in both Photolithography Process & Equipment. Lead the teams to improve Tool Response Time, Root Cause Analysis, SPC OOC/OOS Resp...
Apr 1, 2014 — Dec 2018

Process Owner - Metrology Cd Sem

4000 north Flash Dr, Lehi, UT 84005
Developing & Improving CD (Critical Dimensions) measurements on AMAT SEMs (Scanning Electron Microscope) on 3DxP memory. As the Process Owner, I'm responsible for the RPT (Raw Processing Tim...
from Dec 2018

Photolithography Tactical Lead Process Engineer

4000 north Flash Dr, Lehi, UT 84005
Jan 2011 — Apr 2014

Photolithography Process Engineer

4000 north Flash Dr, Lehi, UT 84005
Jun 2007 — Dec 2010

Patent Analysis and Prior Art Searching

200 Summit Lake Dr, Valhalla, NY 10595
Aug 2005 — May 2006

Furniture Delivery

Utah
2002 — 2006

Patent Analysis and Prior Art Searching

2004 — 2005

Occupations

Executive
Owner
Supervisor
Health Specialist
Technicians
Sales Specialist
Equipment Tools Purchasing Agent
Military
Army Specialist
Artist
Model
Chief Executive
Managers
Department Store Salesperson
Retail Salesperson

Skills

Design of Experiments
Lithography
Characterization
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